Atomic Force Microscopy Based Nanorobotics von Hui Xie | Modelling, Simulation, Setup Building and Experiments | ISBN 9783642203299

Atomic Force Microscopy Based Nanorobotics

Modelling, Simulation, Setup Building and Experiments

von Hui Xie, Cagdas Onal, Stéphane Régnier und Metin Sitti
Mitwirkende
Autor / AutorinHui Xie
Autor / AutorinCagdas Onal
Autor / AutorinStéphane Régnier
Autor / AutorinMetin Sitti
Buchcover Atomic Force Microscopy Based Nanorobotics | Hui Xie | EAN 9783642203299 | ISBN 3-642-20329-9 | ISBN 978-3-642-20329-9

Atomic Force Microscopy Based Nanorobotics

Modelling, Simulation, Setup Building and Experiments

von Hui Xie, Cagdas Onal, Stéphane Régnier und Metin Sitti
Mitwirkende
Autor / AutorinHui Xie
Autor / AutorinCagdas Onal
Autor / AutorinStéphane Régnier
Autor / AutorinMetin Sitti

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.