Reihe Frontiers in Electronic TestingAndrei Pavlov × CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesProcess-Aware SRAM Design and TestAndrei PavlovSpringer NetherlandSoftcover2010171,19 € CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesProcess-Aware SRAM Design and TestAndrei PavlovSpringer NetherlandHardcover2008171,19 € CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesProcess-Aware SRAM Design and TestAndrei PavlovSpringer NetherlandeBook2008160,49 €
