Reihe Frontiers in Electronic TestingSaid Hamdioui × Testing Static Random Access MemoriesDefects, Fault Models and Test PatternsSaid HamdiouiSpringer USeBook201396,29 € Testing Static Random Access MemoriesDefects, Fault Models and Test PatternsSaid HamdiouiSpringer USSoftcover2010106,99 € Testing Static Random Access MemoriesDefects, Fault Models and Test PatternsSaid HamdiouiSpringer USHardcover2004106,99 €