Buchportal für Bücher die eine ISBN tragen.

Reihe IEEE Press Series on Microelectronic Systems

Buchcover CMOS

Circuit Design, Layout, and Simulation

John Wiley & Sons

Buchcover Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Alvin W. Strong

John Wiley & Sons

Buchcover CMOS

Mixed-Signal Circuit Design

John Wiley & Sons

Buchcover Nonvolatile Memory Technologies with Emphasis on Flash

Nonvolatile Memory Technologies with Emphasis on Flash

A Comprehensive Guide to Understanding and Using Flash Memory Devices

John Wiley & Sons

Buchcover DRAM Circuit Design

DRAM Circuit Design

Fundamental and High-Speed Topics

John Wiley & Sons

Buchcover Advanced Electronic Packaging

Advanced Electronic Packaging

John Wiley & Sons

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